Electric field-induced grain boundary degradation mechanism in yttria stabilized zirconia

The degradation mechanism of flash sintering 8 mol% yttria stabilized zirconia, which results in poor densification and crumbling the samples under direct current, was investigated. Microstructure analysis revealed highly strained grain boundaries nanopore formation at after with a current. A higher current density experiment gave varied microstructure internal dimpling near negative electrode, porous “swiss-cheese” like pellet interior, melting recrystallization positive electrode. These characteristics were not observed an alternating Phase field simulations predicted oxygen vacancy buildup potential reduced phases along boundaries, lead to depletion free holes dramatic increase electrons. This high tensile stresses explains